Multistage parallel-to-serial conversion of read data in...

Static information storage and retrieval – Read/write circuit – Parallel read/write

Reexamination Certificate

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C365S194000, C365S233100, C365S189011, C365S230080

Reexamination Certificate

active

07054215

ABSTRACT:
Data bits are prefetched from memory cells in parallel and are read out serially. The memory includes multiple stages (1710) of latches through which the parallel data is transferred before being read out serially. The multiple stages provide suitable delays to satisfy variable latency requirements (e.g. CAS latency in DDR2). The first bit for the serial output bypasses the last stage (1710.M). In some embodiments, the control signals controlling the stages other than the last stage in their providing the first data bit to the memory output are not functions of the control signals controlling the last stage providing the subsequent data bits to the memory output.

REFERENCES:
patent: 6011737 (2000-01-01), Li et al.
patent: 6115321 (2000-09-01), Koelling et al.
patent: 6285578 (2001-09-01), Huang
patent: 6549444 (2003-04-01), Kyung et al.
patent: 6563747 (2003-05-01), Faue
patent: 6597630 (2003-07-01), Kubo et al.
patent: 6600691 (2003-07-01), Morzano et al.
patent: 6621747 (2003-09-01), Faue
patent: 6882579 (2005-04-01), Keeth et al.
patent: 6909643 (2005-06-01), Kwean
patent: 6914829 (2005-07-01), Lee
patent: 2002/0149960 (2002-10-01), Yoo et al.
patent: 2003/0026161 (2003-02-01), Yamaguchi et al.
JEDEC Standard: DDR2 SDRAM Specification: JESD79-2A, Jan. 2004, JEDEC Solid State Technology Association.
Preliminary Data Sheet: 1G bits DDR2 SDRAM: EDE1104AASE (256M words ×4 bits): EDE1108AASE (128M words × 8bits); Elpida Memory, Inc. 2003.
Davis, Brian; Mudge, Trevor; Jacob, Bruce; Cuppu, Vinodh “DDR2 and Low Latency Variants” Electrical Engineering and Computer Science, University of Michigan, Ann Arbor; Electrical & Computer Engineering, University of Maryland, College Park, pp. 1-15.
HYS64T32000GDL (256 Mbyte): HYS64R64020GDL (512 Mbyte) DDR2 Small Outline DIMM Modules; Data Sheet, vol. 82, Oct. 2003, Infineon Technologies.
Preliminary Data Sheet: 512 M bits DDR SDRAM: EDD5104ABTA (128M words × 4 bits): EDD5108ABTA (64M words × 8 bits); Elpida Memory, Inc. 2002-2003.
JEDEC Standard: Double Data Rate (DDR) SDRAM Specification: JESD79D, Jan. 2004, JEDEC Solid State Technology Association.
U.S. Appl. No. 10/794,782, entitled “Data Sorting in Memories,” filed Mar. 3, 2004.

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