Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-10-13
2009-12-01
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C349S040000
Reexamination Certificate
active
07626414
ABSTRACT:
A plurality of gate lines are formed on an insulating substrate in the horizontal direction, a gate shorting bar connected to the data lines is formed in the vertical direction and a gate insulating film is formed thereon. A plurality of data lines intersecting the gate lines are formed on the gate insulating film in the vertical direction, and a data shorting bar connected to the data lines is formed outside the display region. A first shorting bar is formed on the gate insulating film, located between the gate lines and the gate shorting bar, and connected to the odd gate lines. A second secondary shorting bar is formed parallel to the first shorting bar and connected to the even gate lines.
REFERENCES:
patent: 5598283 (1997-01-01), Fujii et al.
patent: 5668032 (1997-09-01), Holmberg et al.
patent: 6005647 (1999-12-01), Lim
patent: 6013923 (2000-01-01), Huang
patent: 6025891 (2000-02-01), Kim
patent: 6028442 (2000-02-01), Lee et al.
patent: 6091464 (2000-07-01), Song
patent: 6111620 (2000-08-01), Nishiki et al.
patent: 6734925 (2004-05-01), Lee et al.
patent: 6982768 (2006-01-01), Ohori et al.
patent: 6982569 (2007-12-01), Lee et al.
patent: 7375375 (2008-05-01), Yamazaki et al.
patent: 2001/0045997 (2001-11-01), Kim
patent: 1-233425 (1989-09-01), None
patent: 2-135490 (1990-05-01), None
patent: 03-094223 (1991-04-01), None
patent: 3-134628 (1991-06-01), None
patent: 04-179926 (1992-06-01), None
patent: 4179926 (1992-06-01), None
patent: 5005866 (1993-01-01), None
patent: 7-5481 (1994-01-01), None
patent: 6-82817 (1994-03-01), None
patent: 6-82836 (1994-03-01), None
patent: 8-15733 (1996-01-01), None
patent: 8005691 (1996-01-01), None
patent: 08-328033 (1996-12-01), None
patent: 09-074253 (1997-03-01), None
patent: 9-127552 (1997-05-01), None
patent: 9185072 (1997-07-01), None
patent: 10-020334 (1998-01-01), None
patent: 10-133214 (1998-05-01), None
patent: 10-186392 (1998-07-01), None
patent: 11-119683 (1999-04-01), None
Kim Dong-Gyu
Lee Sang-Kyoung
Moon Min-Hyung
Innovation Counsel LLP
Samsung Electronics Co,. Ltd.
Tang Minh N
LandOfFree
Multiple testing bars for testing liquid crystal display and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Multiple testing bars for testing liquid crystal display and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multiple testing bars for testing liquid crystal display and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4059032