Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-07-24
2008-11-04
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C349S040000
Reexamination Certificate
active
07446556
ABSTRACT:
A plurality of gate lines are formed on an insulating substrate in the horizontal direction, a gate shorting bar connected to the data lines is formed in the vertical direction and a gate insulating film is formed thereon. A plurality of data lines intersecting the gate lines are formed on the gate insulating film in the vertical direction, and a data shorting bar connected to the data lines is formed outside the display region. A first shorting bar is formed on the gate insulating film, located between the gate lines and the gate shorting bar, and connected to the odd gate lines. A second secondary shorting bar is formed parallel to the first shorting bar and connected to the even gate lines.
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Kim Dong-Gyu
Lee Sang-Kyoung
Moon Min-Hyung
MacPherson Kwok & Chen & Heid LLP
Samsung Electronics Co,. Ltd.
Tang Minh N
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