Multiple testing bars for testing liquid crystal display and...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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C349S040000

Reexamination Certificate

active

06982569

ABSTRACT:
A plurality of gate lines are formed on an insulating substrate in the horizontal direction, a gate shorting bar connected to the data lines is formed in the vertical direction and a gate insulating film is formed thereon. A plurality of data lines intersecting the gate lines are formed on the gate insulating film in the vertical direction, and a data shorting bar connected to the data lines is formed outside the display region. A first shorting bar is formed on the gate insulating film, located between the gate lines and the gate shorting bar, and connected to the odd gate lines. A second secondary shorting bar is formed parallel to the first shorting bar and connected to the even gate lines.

REFERENCES:
patent: 5598283 (1997-01-01), Fujii et al.
patent: 5668032 (1997-09-01), Holmberg et al.
patent: 6005647 (1999-12-01), Lim
patent: 6013923 (2000-01-01), Huang
patent: 6025891 (2000-02-01), Kim
patent: 6111620 (2000-08-01), Nishiki et al.
patent: 6734925 (2004-05-01), Lee et al.
patent: 2001/0045997 (2001-11-01), Kim

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