Multiple source and detection frequencies in detecting threshold

Details Multiple source and detection frequencies in detecting threshold Multiple source and detection frequencies in detecting threshold

1993-07-15

1995-03-14

Berman, Jack I.

Radiant energy

Inspection of solids or liquids by charged particles

250307, 2041531, 204400, 204412, H01J 3728

Patent

active

053978960

ABSTRACT:
Multiple frequency sources are used to apply a time varying signal to a scanning tunneling microscope and a current or voltage passing between the electrodes of the microscope is measured by a microwave spectrum
etwork analyzer which detects simultaneously at the multiple input frequencies and combinations thereof. This permits multiple substances to be monitored simultaneously. By choosing appropriate frequencies of input signals to be mixed or combined before application to the sample, it is possible to measure at a difference frequency which may improve signal to noise ratio and possible to match generating and reaction potentials and relaxation times to render detection possible. When applied to an array of Coulomb blockade devices used as a current standard, accuracy of the standard can be tested and the signal-to-noise ratio can be improved in the measurements, or the thresholds of the devices can be detected. Multiple frequency sources of light are used to apply a light signal to a scanning near-field optical microscope. After being modulated by the sample, the signal is detected and a spectrometer which detects simultaneously at the multiple input frequencies and combinations thereof. This permits multiple substances to be monitored simultaneously.

REFERENCES:
patent: 3566262 (1971-02-01), Thompson
patent: 4941753 (1990-07-01), Wickramasinghe
patent: 5060248 (1990-12-01), Dumoulin
patent: 5268573 (1993-12-01), Weiss et al.
patent: 5281814 (1994-01-01), Weiss et al.
"A New Impedence Spectrometer for the Investigation of Electrochemical Systems," by Poporov et al., Rev. of Scientified Instruments, vol. 63, No. 11 pp. 5366-5372, Nov. 1992, N.Y.
"Scanning Tunneling Microscopy, Resonant Tunneling, and Counting Electrons: A Quantum Strandard of Current," by Guinea et al., Phys. Rev. Letters, vol. 65, No. 3, pp. 281-284, Jul. 1990, N.Y.
"Generation of Microwave Radiation in the Tunneling Junction of a Scanning Tunneling Microscope," by Krieger et al., Journ. of Vac. Sci. and Technol., vol. 41, No. 14, pp. 10229-10232, May 15, 1990, N.Y.
"Laser-Driven Scanning Tunneling Microscope," by Volker et al., Phys. Rev. Let., vol. 66, No. 13, pp. 1717-1720, Apr. 1, 1991, N.Y.
G. Meijer et al., Nature, 348, 621 (1990).
"Non-Linear Alternating-Current Tunneling Microscopy," Kochanski, Physical Review Letters, 62:19, pp. 2285-2288, May 1989.
"A Versatile Microwave-Frequency-Compatible Scanning Tunneling Microscope," Stranick et al., Rev. Sci. Instrum., 64(5):1232-1234, May 1993.
"Course Tip Distance Adjustment and Positioner for a Scanning Tunneling Microscope," Frohn et al., Rev. Sci. Instrum., 60(6):1200-1201, Jun. 1989.
"Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications," edited by Binn et al., NATO ASI Series, Series E: Applied Sciences, vol. 235, pp. 19-33.
Product brochure entitled "The Beetle STM-A Versatile, UHV Compatible Scanning Tunneling Microscope".
"An Easily Operable Scanning Tunneling Microscope," Besocke, Surface Science,181:145-153, 1987.

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