Multiple layer floating gate non-volatile memory device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S314000, C257S315000, C257SE29129, C257SE29300

Reexamination Certificate

active

07906806

ABSTRACT:
The disclosed systems and methods relate to floating gate non-volatile memory cells, with a floating gate comprising at least two layers constructed in different conductive or semiconductive materials. At least two of the layers of the floating gate are separated by an intermediate dielectric layer having a predetermined thickness enabling direct tunneling current between the layers.

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European Search Report, European Application No. 08170244.1 dated Feb. 5, 2009.

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