X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2008-11-17
2010-10-05
Ho, Allen C. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S087000, C378S088000, C378S146000, C378S196000, C378S197000
Reexamination Certificate
active
07809109
ABSTRACT:
An apparatus and method for inspecting personnel or their effects. A first and second carriage each carries a source for producing a beam of penetrating radiation incident on a subject. A positioner provides for synchronized relative motion of each carriage vis-à-vis the subject in a direction having a vertical component. A detector receives radiation produced by at least one of the sources after the radiation interacts with the subject.
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Chalmers Alexander
DiMare Joseph
Fleury Dean
Mastronardi Richard
Schubert Jeffrey R.
American Science and Engineering, Inc.
Ho Allen C.
Sunstein Kann Murphy & Timbers LLP
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