Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-10-03
2006-10-03
Flynn, Nathan J. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S213000, C257S288000, C257SE27112
Reexamination Certificate
active
07115947
ABSTRACT:
Disclosed is a method and structure for a fin-type field effect transistor (FinFET) structure that has different thickness gate dielectrics covering the fins extending from the substrate. These fins have a central channel region and source and drain regions on opposite sides of the channel region. The thicker gate dielectrics can comprise multiple layers of dielectric and the thinner gate dielectrics can comprise less layers of dielectric. A cap comprising a different material than the gate dielectrics can be positioned over the fins.
REFERENCES:
patent: 6413802 (2002-07-01), Hu et al.
patent: 6787439 (2004-09-01), Ahmed et al.
patent: 6858478 (2005-02-01), Chau et al.
patent: 2005/0040444 (2005-02-01), Cohen
patent: 2005/0110085 (2005-05-01), Zhu et al.
Clark, Jr. William F.
Nowak, Jr. Edward J.
Flynn Nathan J.
Gibb I.P. Law Firm LLC
Quinto Kevin
Sabo, Esq. William D.
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