Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-09-26
2000-03-14
Brown, Glenn W.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324760, 324765, 3241581, G01R 3128
Patent
active
06037795&
ABSTRACT:
A test layout increases the sample size of electromigration experiments. Through pad sharing, the number of structures tested can be increased, allowing hundreds of identical structures to be tested in a single high temperature oven door.
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Filippi Ronald G.
Poulin James J.
Raviart Robert D.
Rodbell Kenneth P.
Smith Richard G.
Brown Glenn W.
International Business Machines - Corporation
Townsend Tiffany L.
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