Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2005-04-26
2005-04-26
Iqbal, Nadeem (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S727000
Reexamination Certificate
active
06886110
ABSTRACT:
A method and system is provided for emulating individual JTAG devices in a multiple device boundary scan chain. The method includes coupling an emulator to the scan chain, and obtaining the topology of the scan chain. One device within the scan chain is then selected, and at least one other device within the scan chain is placed into bypass mode. Emulation instructions are sent to the scan chain, so that the emulation instructions bypass the at least one other device and are executed by the one device.
REFERENCES:
patent: 5448576 (1995-09-01), Russell
patent: 5546562 (1996-08-01), Patel
patent: 5570375 (1996-10-01), Tsai et al.
patent: 5581101 (1996-12-01), Ning et al.
patent: 5828579 (1998-10-01), Beausang
patent: 5863702 (1999-01-01), Ohbayashi et al.
patent: 5909453 (1999-06-01), Kelem et al.
patent: 5960321 (1999-09-01), Hsieh et al.
patent: 5970241 (1999-10-01), Deao et al.
patent: 6055649 (2000-04-01), Deao et al.
patent: 6071810 (2000-06-01), Wada et al.
patent: 6136686 (2000-10-01), Gambino et al.
patent: 6153519 (2000-11-01), Jain et al.
patent: 6185732 (2001-02-01), Mann et al.
patent: 6230119 (2001-05-01), Mitchell
patent: 6289300 (2001-09-01), Brannick et al.
patent: 6381717 (2002-04-01), Bhattacharya
patent: 6389565 (2002-05-01), Ryan et al.
patent: 20030163773 (2003-08-01), O'Brien et al.
patent: 20030225566 (2003-12-01), O'Brien et al.
patent: 20030233221 (2003-12-01), O'Brien et al.
patent: 56-125844 (1981-10-01), None
patent: 6-291202 (1994-10-01), None
patent: 63-199859 (1998-08-01), None
Boundary-Scan Tutorial Copyright 2000 Asset InterTech, Inc. and, R.G. Bennetts (www.asset intertech.com/PDF/boundaryscan-turorial.pdf).
Fay Kaplun & Marcin LLP
Iqbal Nadeem
Wind River Systems, Inc.
LandOfFree
Multiple device scan chain emulation/debugging does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Multiple device scan chain emulation/debugging, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multiple device scan chain emulation/debugging will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3426773