Multilevel metallization process

Chemistry: electrical and wave energy – Processes and products

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357 71, C25D 502, H01L 2348

Patent

active

040453022

ABSTRACT:
A method of making a multilevel conductor pattern for a semiconductor device. An aluminum layer on the substrate surface provides a situs for first level conductors. Successive soft and hard anodization steps are advantageously used to provide excellent intralevel isolation and interlevel electrical connection in desired areas. First level conductor sites are masked and the two anodized films are selectively removed in the desired nonconductive areas. The remaining first level aluminum is completely anodized. An insulating layer is then deposited and vias are formed therethrough to connect a subsequently deposited second level metallization layer with the conductor sites.

REFERENCES:
patent: 3741880 (1973-06-01), Shiba et al.
patent: 3798135 (1974-03-01), Bracken et al.
patent: 3864217 (1975-02-01), Takahata et al.
patent: 3939047 (1976-02-01), Tsunemitsu et al.

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