Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making named article
Reexamination Certificate
2008-05-06
2008-05-06
Huff, Mark F. (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making named article
C430S311000, C430S322000
Reexamination Certificate
active
07368228
ABSTRACT:
A method of creating a microelectromechanical systems (MEMS) device includes applying a layer of photoresist to a lower layer to create a multilayer MEMS device. The method includes transferring the layer of photoresist to the lower layer. The method can also include spincoating the photoresist onto a release layer, softbaking the spincoated photoresist to at least partially dry it, transferring the photoresist to form a layer of the multilayer MEMS device, and exposing the photoresist to light to crosslink it. The multilayer MEMS device includes a plurality of layers of photoresist.
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Advances in Abrasive Technology V, website pages from http://www.scientific.net/0-87849-910-5/19.htm, Nov. 7, 2003.
SU-8: A Thick Photo-Resist for MEMS, website pages from http://aveclafaux.freeservers.com/SU-8.html, Nov. 4, 2003.
Fay Sharpe LLP
Huff Mark F.
Palo Alto Research Center Incorporated
Sullivan Caleen O.
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