Multifunctional probe array system

Measuring and testing – Surface and cutting edge testing – Roughness

Reexamination Certificate

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C250S306000

Reexamination Certificate

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11234401

ABSTRACT:
A probe array for includes a handle, a first probe and a second probe. The first probe has a first shank, connected to the handle, and a first tip; and the second probe has a second shank, connected to the handle, and second tip. The first tip contains a different material from the second tip. The probe array may be used to write on a surface by contacting the first tip with a surface, where a first ink is on the first tip. This writing method may further include lifting the first tip from the surface and contacting the second tip with the surface.

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