Light scanning apparatus

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

Reexamination Certificate

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Details

C359S198100

Reexamination Certificate

active

11330115

ABSTRACT:
A light is emitted from a light emitting element toward the other surface in a thickness direction of a scanning mirror which can be angularly displaced about an axial line. At least either one of a first light receiving portion and a second light receiving portion receives a light which is emitted from the light emitting element and reflected by a reflecting mirror. The first light receiving portion, the second light receiving portion, and the signal output section produce an electronic signal containing position information which indicates a position which is irradiated with the above-mentioned light. This position information indicates an amount of angular displacement of the scanning mirror. On the basis of this position information, a driving section scans the scanning mirror so that the predetermined irradiation position can be irradiated with a light emitted from a first light source.

REFERENCES:
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patent: 5648618 (1997-07-01), Neukermans et al.
patent: 6262827 (2001-07-01), Ueda et al.
patent: 6721112 (2004-04-01), Ikegame et al.
patent: 6844952 (2005-01-01), Dalziel
patent: 11-288444 (1999-10-01), None
patent: 2002-524271 (2002-08-01), None
patent: WO-00/13210 (2000-03-01), None
W.G. Pfann et al., Semiconducting Stress Transducers Utilizing the Transverse and Shear Piezoresistance Effects, Journal of Applied Physics, Oct. 1961, 2008, 32-10.

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