Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-09-13
2005-09-13
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C714S724000
Reexamination Certificate
active
06943577
ABSTRACT:
A test apparatus for testing a multi-chip package comprising a multiplicity of semiconductor chips, which includes a test driver having one drive channel and at least one input/output channel. A test board is mounted with the multi-chip package. Drive pins of the semiconductor chips are parallel connected to the drive channel, and input/output pins of the semiconductor chips are parallel connected to the input/output channel.
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English language abstract of Japnese Publication No. 09-311161, Dec. 1997.
English language abstract of Korean Publication No. 2001-0104719, Nov. 2001.
Bang Jeong-Ho
Heo Kyoung-Il
Ju Ki-Bong
Kwon Hyuk
Lee Hyoung-Young
Karlsen Ernest
Marger & Johnson & McCollom, P.C.
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