Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Multiple housings
Reexamination Certificate
2006-03-21
2010-12-14
Smith, Zandra (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
Multiple housings
C257S686000, C257S690000, C257S723000, C257S773000, C257SE21526, C257SE23171, C257SE25013
Reexamination Certificate
active
07851898
ABSTRACT:
Disclosed is a multichip package or system-in package which the logic chip includes a selector circuit which, by transmitting a test mode select signal or a test mode select command to the logic chip, enables access from a logic signal pin connected to the logic chip, to a memory control signal to each of the “m” number of memory chips; and the memory control signal, when viewed from the logic chip, is connected using a one-for-one wiring scheme or a one-for-up-to-m branch wiring scheme, between the selector circuit and each of the “m” number of memory chips. This multichip package or system-in package is low in noise and high in operational reliability.
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Hirose Yukitoshi
Katagiri Mitsuaki
Nakamura Satoshi
Suga Takashi
Chiu Tsz K
Elpida Memory Inc.
Hitachi , Ltd.
Mattingly & Malur, P.C.
Smith Zandra
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