Multiblock semiconduction storage device including simultaneous

Static information storage and retrieval – Read/write circuit – Testing

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36518902, 36518904, G11C 2900

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active

053011554

ABSTRACT:
A semiconductor storage device including a plurality of blocks each having an array of memory cells includes an exclusive OR circuit provided in each of the plurality of blocks for making a determination as to whether data written in memory cells in the blocks are normally read. Exclusive OR circuits of a plurality of memory cell array blocks are connected to an OR circuit. With an output signal from the OR circuit, a determination is made as to whether a plurality of memory cell array blocks are normal or not. Since test data from a plurality of memory cell array blocks are simultaneously examined by an OR circuit, a test time for the semiconductor storage device can be reduced.

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