Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Responsive to non-optical – non-electrical signal
Reexamination Certificate
2011-07-05
2011-07-05
Richards, N Drew (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Responsive to non-optical, non-electrical signal
C257S415000, C438S052000
Reexamination Certificate
active
07973343
ABSTRACT:
A multibit electro-mechanical memory device comprises a substrate, a bit line on the substrate, a first interlayer insulating film on the bit line, first and second lower word lines on the first interlayer insulating film, the first and second lower word lines separated horizontally from each other by a trench, a spacer abutting a sidewall of each of the first and second lower word lines, a pad electrode inside a contact hole, first and second cantilever electrodes suspended over first and second lower voids that correspond to upper parts of the first and second lower word lines provided in both sides on the pad electrode, the first and second cantilever electrodes being separated from each other by the trench, and being curved in a third direction that is perpendicular to the first and second direction; a second interlayer insulating film on the pad electrode, first and second trap sites supported by the second interlayer insulating film to have first and second upper voids on the first and second cantilever electrodes, and first and second upper word lines on the first and second trap sites.
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Decision of Grant, issued Sep. 29, 2008, in related Korean Application No. 10-2007-0050223.
Decision of Grant issued on Sep. 23, 2008 in related Korean Application No. 10-2007-0050226.
Choi In-Hyuk
Kim Min-Sang
Kim Sung-Min
Lee Ji-Myoung
Lee Sung-young
Jung Michael
Mills & Onello LLP
Richards N Drew
Samsung Electronics Co,. Ltd.
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