Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate
2007-06-05
2007-06-05
Tran, Andrew Q. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Having fuse element
C365S230030, C365S230060, C365S189080, C365S189110, C365S096000
Reexamination Certificate
active
11316421
ABSTRACT:
A multi-time programmable semiconductor memory device includes a unit array, a unit decoder and a cell distribution circuit. The unit array includes a plurality of programmable units, each of which has a plurality of one-time programmable cells. The unit decoder generates a unit select signal for selecting a programmable unit of the unit array based on an address signal. The cell distribution circuit generates an odd-numbered cell programming signal for programming one of odd-numbered one-time programmable cells of the plurality of the one-time programming cells of the programmable unit that is selected by the unit select signal, and an even-numbered cell programming signal for programming one of even-numbered one-time programmable cells of the plurality of the one-time programming cells, based on previous data state of the selected programmable unit received from the unit array, and present data state to be programmed to the selected programmable unit.
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English language abstract of Japanese Publication 08-148000.
English language abstract of Japanese Publication 2000-267846.
Jung Jong-Hoon
Kim Gyu-Hong
Marger & Johnson & McCollom, P.C.
Samsung Electronic Co. Ltd.
Tran Andrew Q.
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