Multi-stage waveform detector

Details Multi-stage waveform detector Multi-stage waveform detector

2008-03-18

2009-10-13

Porta, David P (Department: 2884)

Radiant energy

Invisible radiant energy responsive electric signalling

Plural signalling means

Reexamination Certificate

active

07601967

ABSTRACT:
A waveform detector may include multiple stages.

REFERENCES:
patent: 4149902 (1979-04-01), Mauer et al.
patent: 4254330 (1981-03-01), Stauffer et al.
patent: 4804848 (1989-02-01), Horiba et al.
patent: 4980554 (1990-12-01), Ahn
patent: 5691532 (1997-11-01), Hait
patent: 5777326 (1998-07-01), Rockwood et al.
patent: 6180415 (2001-01-01), Schultz et al.
patent: 6627914 (2003-09-01), Komiyama et al.
patent: 6791432 (2004-09-01), Smith et al.
patent: 6938325 (2005-09-01), Tanielian
patent: 6958729 (2005-10-01), Metz
patent: 6969847 (2005-11-01), Davis et al.
patent: 7145124 (2006-12-01), Garrood et al.
patent: 7180065 (2007-02-01), Craig et al.
patent: 7232999 (2007-06-01), Otten, III et al.
patent: 2001/0038325 (2001-11-01), Smith et al.
patent: 2003/0002045 (2003-01-01), Nemat-Nasser et al.
patent: 2004/0066251 (2004-04-01), Eleftheriades et al.
patent: 2004/0114203 (2004-06-01), Batchko
patent: 2004/0184719 (2004-09-01), Kiadeh
patent: 2004/0188617 (2004-09-01), Devitt et al.
patent: 2004/0189528 (2004-09-01), Killen et al.
patent: 2005/0070803 (2005-03-01), Cullum et al.
patent: 2005/0073744 (2005-04-01), Zheludev et al.
patent: 2005/0084268 (2005-04-01), Weigert
patent: 2005/0098720 (2005-05-01), Traynor et al.
patent: 2005/0107125 (2005-05-01), Gilbert
patent: 2005/0134819 (2005-06-01), de Jager
patent: 2005/0146402 (2005-07-01), Sarabandi et al.
patent: 2005/0221128 (2005-10-01), Kochergin
patent: 2005/0247337 (2005-11-01), Chen et al.
patent: 2006/0022875 (2006-02-01), Pidwerbetsky et al.
patent: 2006/0049331 (2006-03-01), Smith
patent: 2006/0065833 (2006-03-01), Craig et al.
patent: 2007/0045541 (2007-03-01), Urey et al.
patent: 2008/0048126 (2008-02-01), Janssen et al.
patent: 2008/0224031 (2008-09-01), Gilchrist
patent: 2008/0265150 (2008-10-01), Holmes
PCT International Search Report; International App. No. PCT/US07/04400; Nov. 3, 2008; pp. 1-2.
PCT International Search Report; International App. No. PCT/US2006/048136; Nov. 7, 2008; pp. 1-2.
PCT International Search Report; International App. No. PCT/US 07/04209, Nov. 26, 2008, pp. 1-2.
Bergman, David J.; Stockman, Mark I.; “Surface Plasmon Amplification by Stimulated Emission of Radiation: Quantum Generation of Coherent Surface Plasmons in Nanosystems”; Physical Review Letters; bearing dates of Sep. 15, 2002, Jan. 14, 2003, Jan. 17, 2003, and 2003; pp. 027402-1-027402-4; vol. 90, No. 2; The American Physical Society.
Brock, Jeffrey B.; Houck, Andrew A.; Chuang, Isaac L.; “Focusing inside negative index materials”; Applied Physics Letters; bearing dates of Sep. 27, 2004, Apr. 19, 2004, Jul. 28, 2004, Nov. 8, 2004, and 2004; pp. 2472-2474; vol. 85, No. 13; American Institute of Physics.
Caloz, Christophe; Itoh, Tatsuo;Electromagnetic Metamaterials: Transmission Line Theory and Microwave Applications; bearing a date of Nov. 2005; ISBN: 0-471-75431-5; Wiley-IEEE Press.
Dalton, Larry R.; “Integrated Optics/Electronics Using Electro-Optic Polymers”; Mat. Res. Soc. Symp. Proc.; bearing a date of 2004; pp. L.7.2.1-L.7.2.12; vol. 817; Materials Research Society.
Driessen, Alfred; Dekker, Ronald; Diemeer, Mart B.J.; Geuzebroek, Douwe H.; Hoekstra, Hugo J.W.M.; Klein, Edwin J.; and Leinse, Arne; “Microresonators as promising building blocks for VLSI photonics”; Proceedings of SPIE—Integrated Optics: Theory and Applications; bearing dates of Aug. 31-Sep. 2, 2005; pp. 59560Q1-59560Q14+ Cover Pg and Blank Pg (16 pages total); vol. 5956; The International Society for Optical Engineering.
Eleftheriades, G. V.; Balmain, K. G;Negative Refraction Metamaterials: Fundamental Principles and Applications; bearing a date of Jul. 7, 2005; ISBN: 0-471-60146-2; Wiley-IEEE Press.
Fang, Nicholas; Zhang, Xiang; “Imaging properties of a metamaterial superlens”; Applied Physics Letters; bearing dates of Sep. 24, 2002, Nov. 18, 2002, Jan. 13, 2003 and 2003; pp. 161-163; vol. 82, No. 2; American Institute of Physics.
Gay-Balmaz, Philippe; Martin, Olivier J.F.; Electromagnetic resonances in individual and coupled split-ring resonators; Journal of Applied Physics; bearing dates of Dec. 27, 2001, Jun. 10, 2002, Sep. 1, 2002, and 2002; pp. 2929-2936; vol. 92, No. 5; American Institute of Physics.
Gonzalez, Francisco Javier; Alda, Javier; LLIC, Bojan; Boreman, Glenn D.; “Infrared antennas coupled to lithographic Fresnel zone plate lenses”; Applied Optics; bearing dates of Nov. 20, 2004 and 2004; pp. 6067-6073; vol. 43, No. 33; Optical Society of America.
Greegor, R.B., Parazzoli, C.G., Nielsen, J.A., Thompson, M.A., Tanielian, M.H., and Smith, D.R.; “Simulation and testing of a graded negative index of refraction lens”; Applied Physics Letters; bearing dates of Jan. 26, 2005, Jul. 11, 2005, Aug. 25, 2005 and 2005; pp. 091114-1: 091114-3; vol. 87, Issue 091114 (2005); American Institute of Physics; located at: http://ceta.mit.edu/adm/LHM—paper/papers/257.pdf; printed onDec. 19, 2005.
Jenkins, Francis A.; White, Harvey E.;Fundamentals of Optics; bearing dates of 1957, 1976, 1950, and 1937; Fourth Edition; McGraw-Hill, Inc.
Jimenez, J.L.; Fonseca, L.R.C.; Brady, D.J.; Leburton, J.P.; Wohlert, D.E.; Cheng, K.Y.; “The quantum dot spectrometer”; Appl. Phys. Lett.; bearing dates of Dec. 15, 1997, Jun. 7, 2002, Oct. 14, 1997, Sep. 15, 1997, and 1997; pp. 3558-3560; vol. 71, No. 24; American Institute of Physics.
Li, Le-Wei; Yao, Hai-Ying; Wu, Qun; and Chen, Zhi-Ning; “Broad-bandwidth and low-loss metamaterials: theory, design and realization;” Journal of Zhejiang University Science A; bearing dates of Sep. 5, 2005, Oct. 10, 2005, and 2006; printed on Feb. 15, 2006; pp. 5-23; vol. 7; Issue 1; located at http://www.edu.cn/jzus/2006/A0601/A060102.pdf.
Pedrotti, S.J., Frank L.; Pedrotti, Leno S.;Introduction to Optics; bearing dates of 1993, 1987; Second Edition; Prentice-Hall, Inc.
Pendry, J.B.; “Negative Refraction Makes a Perfect Lens”; Physical Review Letters; bearing dates of Apr. 25, 2000, Oct. 30, 2000 and 2000; pp. 3966-3969; vol. 85, No. 18; The American Physical Society.
Shelby, R.A.; Smith, D.R.; Schultz, S.; “Experimental Verification of a Negative Index of Refraction”; Science; bearing dates of Apr. 6, 2001, Jan. 8, 2001, Feb. 22, 2001, and Mar. 8, 2001; pp. 77-79; vol. 292; located at: www.sciencemag.org.
Smith, D.R., Mock, J.J., Starr, A.F., Schurig, D.,; “A gradient index metamaterial”(Pre-Print); bearing dates of Jul. 11, 2004, and Jul. 7,2004; pp. 1-5; located at: http://arxiv.org/ftp/physics/papers/0407/0407063.pdf; printed on Dec. 19, 2005.
Smith, D.R.; Padilla, Willie J.; Vier, D.C.; Nemat-Nasser, S.C.; Schultz, S.; “Composite Medium with Simultaneously Negative Permeability and Permittivity”; Physical Review Letters; bearing dates of May 1, 2000, Dec. 2, 1999, and 2000; pp. 4184-4187; vol. 84, No. 18; The American Physical Society.
Smith, David R.; Rye, Patrick; Vier, David C.; Starr, Anthony F.; Mock, Jack J.; and Perram, Timothy; “Design and Measurement of Anisotropic Metamaterials that Exhibit Negative Refraction”; IEICE Trans. Electron; bearing dates of Sep. 3, 2003, Nov. 25, 2003, and Mar. 2004; pp. 359-370; vol. E87-C, No. 3.
Smith, David R.; Vier, David C.; “Design of Metamaterials with Negative Refractive Index”; Proc. of SPIE; pp. 52-63; vol. 5359.
Smith, D.R.; Pendry, J.B.; Wiltshire, M.C.K.; “Metamaterials and Negative Refractive Index”; Science- Review; bearing a date of Aug. 6, 2004; pp. 788-792; vol. 305; located at: www.sciencemag.org.
Soukoulis, Costas M.; Photonic Crystals and Light Localization in the 21st Century; Proceedings of the NATO Advanced Study Institute on Photonic Crystals and Light Localization, Crete, Greece, Jun. 18-30, 2000 (NATO Science Series: C: Mathematical & Physical Sciences); bearing dates of Jun. 18-30, 2000 and May 1, 2001; ISBN: 0-792-36948-3; NATO Science Series: C: Mathematical & Physical Sciences; Kluwer Academic Publishers.
Wang, Y.; Kempa, K.; Kimball, B.

Affiliated with

Also associated with

Rating

Multi-stage waveform detector does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multi-stage waveform detector, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multi-stage waveform detector will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4102991