Multi-purpose BER tester (MPBERT) for very high RZ and NRZ...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing

Reexamination Certificate

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C398S027000

Reexamination Certificate

active

06950972

ABSTRACT:
A multi-purpose bit error rate tester (MPBERT) and a method of bit error rate (BER) testing of electrical and optical components and subsystems of electrical and optical communications systems is provided. The invention provides for bit error rate testing both in the optical and the electrical domain, and for bit error rate testing at higher than achievable rates in the electrical domain by multiplexing and demultiplexing in the optical domain. An MPBERT constructed according to the invention incorporates at least one optical multiplexer, and advantageously incorporates at least one optical demultiplexer, and in some embodiments uses high data rate optical RZ to NRZ conversion and high data rate optical NRZ to RZ conversion.

REFERENCES:
patent: 5548399 (1996-08-01), Takai et al.
patent: 6469823 (2002-10-01), Kikuchi et al.
Sokolowska et al., Application of optoelectronic techniques to high speed testing, 1994, IEEE, p. 710-719.
Shake et al, Determination of the origin BER degradation utlizing asynchronous amplitude histograms, Jul. 2001, Laser & Electro-Optics 2001 C/EO? Pasific RIM 2001.vol. 2. the 4th Pacific Rim Conference vol. 2., p. II-560 to II-561.
Jae Lee et al., Polarisation-independntt, stable, all optical clock recovery using an SOA/grating filter wavelength converter, Aug. 1999, Electronics Letters vol. 35, No. 16, p. 1368-1370.
Mikkelsen et al., 40Gbit/s all-optical wavelength converter and RZ to NRZ format adapter realsied by monolithic integrated active Michelson interferometer, Jan. 1997, Electronic Letters vol. 33, No. 2, p. 133-134.

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