Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Encapsulating
Reexamination Certificate
2007-05-30
2010-12-14
Garber, Charles D (Department: 2812)
Semiconductor device manufacturing: process
Packaging or treatment of packaged semiconductor
Encapsulating
Reexamination Certificate
active
07851272
ABSTRACT:
A semiconductor wafer is fabricated. The wafer has a plurality of dies. The plurality of dies include at least operable dies of a first type and operable dies of a second type different from the first type. The dies of the second type are rendered inoperable, while keeping the dies of the first type operable. The wafer is provided with the operable dies of the first type and the inoperable dies of the second type on it, for testing of the dies of the first type.
REFERENCES:
patent: 2005/0245005 (2005-11-01), Benson
patent: 2005/0280434 (2005-12-01), Whetsel
patent: 2006/0175697 (2006-08-01), Kurosawa et al.
patent: 2007/0241078 (2007-10-01), Pratt et al.
patent: 2008/0012098 (2008-01-01), Chow et al.
patent: 2008/0079125 (2008-04-01), Lu et al.
Cheng William
Ching Chen Yung
Lee Hsin-Hui
Lii Mirng-Ji
Duane Morris LLP
Garber Charles D
Koffs Steven E.
Stevenson Andre′ C
Taiwan Semiconductor Manufacturing Co. Ltd.
LandOfFree
Multi-project wafer and method of making same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Multi-project wafer and method of making same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multi-project wafer and method of making same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4167767