Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2006-12-29
2010-10-26
Hur, J. H. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S230050, C365S230030, C365S189050, C365S189030
Reexamination Certificate
active
07821855
ABSTRACT:
A multi-port memory device includes: a bank having a plurality of matrices; a plurality of test data input/output units where data is input/output using a test mode for detecting a defective memory cell; a plurality of ports converted into a decoding device for decoding a command/address at the test mode; a plurality of data transfer lines for transferring data between the matrices and the test data I/O units, wherein the data transfer lines is grouped into the number of matrices; and a plurality of temporary storing units included between the data transfer lines and the matrices for temporarily storing data.
REFERENCES:
patent: 6259628 (2001-07-01), Park
patent: 2005/0251713 (2005-11-01), Lee
patent: 2005/0273670 (2005-12-01), Park
patent: 2007/0073981 (2007-03-01), Im et al.
patent: 2000-172524 (2000-06-01), None
Korean Office Action, with English translation, issued in Korean Patent Application No. KR 10-2006-0091631, mailed Jul. 29, 2008.
Hur J. H.
Hynix / Semiconductor Inc.
IP & T Group LLP
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