Multi-module simultaneous program, erase test, and...

Electrical computers and digital processing systems: memory – Storage accessing and control – Specific memory composition

Reexamination Certificate

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Details

C714S022000, C714S718000, C714S719000, C365S104000, C365S185290, C365S185300

Reexamination Certificate

active

07127550

ABSTRACT:
Methods and apparatus for accessing modules on a flash memory package concurrently during testing are disclosed. According to one aspect of the present invention, a memory device for storing data includes a plurality of modules and a logic block. The plurality of modules each include a plurality of storage elements that hold the data. The logic block is arranged to enable the plurality of modules to be accessed in parallel, and is also arranged to enable the plurality of modules to be accessed serially.

REFERENCES:
patent: 5379401 (1995-01-01), Robinson et al.
patent: 5428566 (1995-06-01), Robinson
patent: 5430859 (1995-07-01), Norman et al.
patent: 5623214 (1997-04-01), Pasiecznik, Jr.
patent: 5663901 (1997-09-01), Wallace et al.
patent: 5675546 (1997-10-01), Leung
patent: 5760643 (1998-06-01), Whetsel
patent: 5848026 (1998-12-01), Ramamurthy et al.
patent: 5867507 (1999-02-01), Beebe et al.
patent: 6072719 (2000-06-01), Tanzawa et al.
patent: 6128219 (2000-10-01), Pio et al.
patent: 6226766 (2001-05-01), Harward
patent: 6233184 (2001-05-01), Barth et al.
patent: 6243839 (2001-06-01), Roohparvar
patent: 6272655 (2001-08-01), Hecht et al.
patent: 6282145 (2001-08-01), Tran et al.
patent: 6546505 (2003-04-01), Swoboda et al.
patent: 6549469 (2003-04-01), Gochi
patent: 6643725 (2003-11-01), Kozakai et al.
patent: 6649931 (2003-11-01), Honma et al.
patent: 2002/0116668 (2002-08-01), Chhor et al.
patent: 0 681 295 (1994-05-01), None

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