Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – With particular signal path connections
Reexamination Certificate
2005-06-24
2008-08-19
Tran, Minh-Loan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Gate arrays
With particular signal path connections
C257S203000, C257S207000, C257S208000, C257S750000, C257S752000, C257S758000, C257S767000, C257S774000, C257SE23142, C257SE23143, C257SE23144, C257SE23145, C257SE23151, C257SE23152, C257SE23153
Reexamination Certificate
active
07414275
ABSTRACT:
Multilevel metallization layouts for an integrated circuit chip including transistors having first, second and third elements to which metallization layouts connect. The layouts minimize current limiting mechanism including electromigration by positioning the connection for the second contact vertically from the chip, overlapping the planes and fingers of the metallization layouts to the first and second elements and forming a pyramid or staircase of multilevel metallization layers to smooth diagonal current flow.
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Greenberg David Ross
Pekarik John Joseph
Scholvin Jorg
Brown Edward W.
International Business Machines - Corporation
Rodela Eddie A
Sabo William D.
Tran Minh-Loan
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