Multi-level interconnections for an integrated circuit chip

Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – With particular signal path connections

Reexamination Certificate

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C257S203000, C257S207000, C257S208000, C257S750000, C257S752000, C257S758000, C257S767000, C257S774000, C257SE23142, C257SE23143, C257SE23144, C257SE23145, C257SE23151, C257SE23152, C257SE23153

Reexamination Certificate

active

07414275

ABSTRACT:
Multilevel metallization layouts for an integrated circuit chip including transistors having first, second and third elements to which metallization layouts connect. The layouts minimize current limiting mechanism including electromigration by positioning the connection for the second contact vertically from the chip, overlapping the planes and fingers of the metallization layouts to the first and second elements and forming a pyramid or staircase of multilevel metallization layers to smooth diagonal current flow.

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