Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2005-08-31
2008-11-04
Smith, Zandra (Department: 2822)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S613000, C438S614000, C257S779000, C257S780000, C257SE21002
Reexamination Certificate
active
07446028
ABSTRACT:
An integrated circuit connection is describe that includes a first, securing member and a second, connection member. The first member, in an embodiment, is a spike that has a portion of its body fixed in a layer of an integrated circuit structure and extends outwardly from the integrated circuit structure. The second material is adapted to form a mechanical connection to a further electrical device. The second material (e.g., solder), is held by the first member to the integrated circuit structure. The first member increases the strength of the connection and assists in controlling the collapse of second member to form the mechanical connection to another circuit. The connection is formed by coating the integrated circuit structure with a patterned resist and etching the layer beneath the resist. A first member material (e.g.,metal) is deposited. The resist is removed. The collapsible material is fixed to the first member.
REFERENCES:
patent: 4205099 (1980-05-01), Jones et al.
patent: 5496775 (1996-03-01), Brooks
patent: 5628031 (1997-05-01), Kikinis et al.
patent: 5733802 (1998-03-01), Inoue et al.
patent: 5766972 (1998-06-01), Takahashi et al.
patent: 5784135 (1998-07-01), Inada et al.
patent: 5824569 (1998-10-01), Brooks et al.
patent: 5864174 (1999-01-01), Yamada et al.
patent: 5872404 (1999-02-01), Lynch et al.
patent: 5888850 (1999-03-01), Havens et al.
patent: 5891795 (1999-04-01), Arledge et al.
patent: 5892273 (1999-04-01), Iwasaki et al.
patent: 5908317 (1999-06-01), Heo
patent: 5912510 (1999-06-01), Hwang et al.
patent: 5933713 (1999-08-01), Farnworth
patent: 5994166 (1999-11-01), Akram et al.
patent: 6043564 (2000-03-01), Brooks et al.
patent: 6051878 (2000-04-01), Akram et al.
patent: 6054772 (2000-04-01), Mostafazadeh et al.
patent: 6107109 (2000-08-01), Akram et al.
patent: 6136689 (2000-10-01), Farrar
patent: 6177725 (2001-01-01), Yamada et al.
patent: 6204095 (2001-03-01), Farnworth
patent: 6222265 (2001-04-01), Akram et al.
patent: 6288335 (2001-09-01), Lee
patent: 6300678 (2001-10-01), Suehiro et al.
patent: 6313529 (2001-11-01), Yoshihara et al.
patent: 6333209 (2001-12-01), Coico et al.
patent: 6351030 (2002-02-01), Havens et al.
patent: 6355507 (2002-03-01), Fanworth
patent: 6383292 (2002-05-01), Brand
patent: 6399425 (2002-06-01), Brand et al.
patent: 6404044 (2002-06-01), Akram et al.
patent: 6420212 (2002-07-01), Mostafazadeh
patent: 6459145 (2002-10-01), Yamada et al.
patent: 6461894 (2002-10-01), Brand
patent: 6498052 (2002-12-01), Brand
patent: 6528890 (2003-03-01), Brand
patent: 6541848 (2003-04-01), Kawahara et al.
patent: 6551863 (2003-04-01), Johnson et al.
patent: 6562663 (2003-05-01), Scheifers et al.
patent: 6569755 (2003-05-01), Yamada et al.
patent: 6583503 (2003-06-01), Akram et al.
patent: 6642136 (2003-11-01), Lee et al.
patent: 6673649 (2004-01-01), Hiatt et al.
patent: 6686268 (2004-02-01), Farnworth
patent: 6706554 (2004-03-01), Ogura
patent: 6713318 (2004-03-01), Maeda et al.
patent: 6723627 (2004-04-01), Kariyazaki et al.
patent: 6734566 (2004-05-01), Honda
patent: 6847121 (2005-01-01), Dotta et al.
patent: 7115998 (2006-10-01), Hiatt et al.
patent: 7220657 (2007-05-01), Ihara et al.
patent: 2001/0040290 (2001-11-01), Sakurai et al.
patent: 2002/0100976 (2002-08-01), Hui et al.
patent: 2004/0043675 (2004-03-01), Hiatt et al.
patent: 2007/0018321 (2007-01-01), Hiatt et al.
Farnworth Warren M.
Hiatt William M.
Micro)n Technology, Inc.
Novacek Christy L
Schwegman Lundberg & Woessner, P.A.
Smith Zandra
LandOfFree
Multi-component integrated circuit contacts does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Multi-component integrated circuit contacts, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multi-component integrated circuit contacts will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4045029