Multi-chip semiconductor packages and methods of operating...

Details Multi-chip semiconductor packages and methods of operating... Multi-chip semiconductor packages and methods of operating...

2006-12-26

2006-12-26

Phung, Aule (Department: 2824)

Static information storage and retrieval

Read/write circuit

Including reference or bias voltage generator

C365S201000, C365S226000

Reexamination Certificate

active

07154790

ABSTRACT:
Integrated circuit devices are provided including first and second chips and a common input/output pad electrically coupled to the first and second chips. At least one of the first and second chips includes a high voltage generator configured to receive an input voltage through the common input/output pad and generate a test voltage responsive to a test mode signal during a test mode of operation. The test voltage is higher than the input voltage. Related methods of operating integrated circuit devices and semiconductor devices are also provided.

REFERENCES:
patent: 5677885 (1997-10-01), Roohparvar
patent: 6898130 (2005-05-01), Kajigaya et al.
patent: 2004/0037150 (2004-02-01), Park et al.
patent: 2004/0061516 (2004-04-01), Murata
patent: 09-198899 (1997-07-01), None
patent: 2001-0039826 (2001-05-01), None
patent: 2004-0040327 (2004-05-01), None

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