Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate
2009-04-24
2011-10-18
Thomas, Toniae (Department: 2822)
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
C257SE21521
Reexamination Certificate
active
08039274
ABSTRACT:
A semiconductor chip may include at least one power supply pad for receiving an external power voltage, at least one input/output pad, an internal function block that may be configured to operate based on a power voltage to at least one of receive and transmit a signal through the input/output pad, and a mode set circuit that may enable or disable the power voltage by a mode set signal in an individual chip test mode.
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Harness & Dickey & Pierce P.L.C.
Samsung Electronics Co,. Ltd.
Thomas Toniae
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