Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2006-12-21
2010-10-12
Nguyen, Tuan T (Department: 2824)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185110, C365S185230, C365S218000, C365S236000
Reexamination Certificate
active
07813184
ABSTRACT:
Methods of performing multi-block erasing operations on a memory device that includes a plurality of memory blocks are provided. Pursuant to these methods, the rate at which a first voltage that is applied to the memory blocks that are to be erased during the multi-block erasing operation rises is controlled based on the number of memory blocks that are to be erased. The memory device may be a flash memory device, and the first voltage may be an erasing voltage that is applied to a substrate of the flash memory device. The rate at which the first voltage rises may be set so that the substrate of the flash memory device reaches the erasing voltage level at approximately the same time regardless of the number of memory blocks that are to be erased.
REFERENCES:
patent: 5841721 (1998-11-01), Kwon et al.
patent: 5995416 (1999-11-01), Naura et al.
patent: 5999446 (1999-12-01), Harari et al.
patent: 6671208 (2003-12-01), Sumitani et al.
patent: 7050336 (2006-05-01), Tomoeda et al.
patent: 7532531 (2009-05-01), Lee
patent: 2005/0248993 (2005-11-01), Lee et al.
patent: 2007/0047327 (2007-03-01), Goda et al.
patent: 2003-331585 (2003-11-01), None
patent: 2004-253021 (2004-09-01), None
patent: 2005-085309 (2005-03-01), None
patent: 100223263 (1999-07-01), None
patent: 102000038416 (2000-07-01), None
patent: 1020020001251 (2002-01-01), None
patent: 1020040008532 (2004-01-01), None
patent: 1020050024248 (2005-03-01), None
Kang Hyung-Seok
Kim Hoo-Sung
Lee Jin-Yub
Le Toan
Myers Bigel & Sibley & Sajovec
Nguyen Tuan T
Samsung Electronics Co,. Ltd.
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