Multi-bit test circuits for integrated circuit memory devices an

Details Multi-bit test circuits for integrated circuit memory devices an Multi-bit test circuits for integrated circuit memory devices an

1996-04-24

1998-05-05

Beausoliel, Jr., Robert W.

Excavating

365201, G01R 3128

Patent

active

057486395

ABSTRACT:
A method for testing a plurality of data bits includes the steps of accepting the plurality of data bits at the test circuit, and comparing first and second data bits from the plurality of data bits to determine if the first and second data bits have a common data value. A first comparison signal is generated responsive to the comparison of the first and second data bits. The first comparison signal has a first logic state when the first and second data bits have a common data value and a second logic state when the first and second data bits have different data values. Third and fourth data bits from the plurality of data bits are compared to determine if the third and fourth data bits have a common data value. A second comparison signal is generated responsive to the comparison of the third and fourth data bits wherein the second comparison signal has the first logic state when the third and fourth data bits have a common data value and the second logic state when the third and fourth data bits have different data values.

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patent: 5400281 (1995-03-01), Morigami
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patent: 5483493 (1996-01-01), Shin
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