Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate
2005-02-22
2005-02-22
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
By polarized light examination
Of surface reflection
Reexamination Certificate
active
06859278
ABSTRACT:
Disclosed is a system for enabling easy sequential setting of different Angles-of-Incidence of a beam of electromagnetic radiation to a surface of a sample system, and to regression based methodology for evaluating and compensating the effects of the presence of electromagnetic beam intercepting angle-of-incidence changing systems, including where desired, parameterization of calibration parameters.
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Goeden Christopher A.
He Ping
Johs Blaine D.
Liphardt Martin M.
Welch James D.
J.A. Woollam Co. Inc.
Pham Hoa Q.
Welch James D.
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