MTP NVM elements by-passed for programming

Static information storage and retrieval – Systems using particular element – Semiconductive

Reexamination Certificate

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C365S185330, C365S184000

Reexamination Certificate

active

11335185

ABSTRACT:
Non-Volatile Memory (NVM) cells include a selection circuit for providing an output based on selecting between an input data signal and an output of a Multiple Time Programmable (MTP) NVM element. The input data signal may be latched by a latch circuit such as a flip-flop first. The selector circuit's output is used to confirm the programming values for the MTP NVM element such that the element can be programmed correctly without losing time by reading the programmed MTP NVM element or reprogramming a misprogrammed element.

REFERENCES:
patent: 6954383 (2005-10-01), Chiu et al.
patent: 2006/0133175 (2006-06-01), Gutnik et al.

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