Moving head for semiconductor wafer polishing apparatus

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Reexamination Certificate

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C451S010000, C451S388000

Reexamination Certificate

active

11532134

ABSTRACT:
Disclosed herein is a moving head for a semiconductor wafer polishing apparatus. The semiconductor wafer polishing apparatus has a table on which a polishing pad is formed, and the moving head mounted via a support unit to hold a wafer relative to a polishing surface of the table. In this case, the moving head includes a sensing means having a load cell and a piezoelectric sensor to measure pressing force and frictional force acting on the wafer provided in the moving head. The present invention relates to the polishing of a semiconductor wafer material from which an integrated circuit is made. That is, the present invention provides a moving head for semiconductor wafer polishing apparatuses, which detects vibrations transmitted to a wafer and outputs signals indicating frictional force and pressing force acting on the wafer, using a load cell and a piezoelectric sensor installed in the moving head so as to maintain optimum frictional force and pressing force relative to the surface of a polishing pad, thus realizing precise final polishing.

REFERENCES:
patent: 5069002 (1991-12-01), Sandhu et al.
patent: 5865665 (1999-02-01), Yueh
patent: 5916009 (1999-06-01), Izumi et al.
patent: 6712670 (2004-03-01), de la Llera et al.
patent: 1997-705718 (1997-08-01), None

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