Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Die bond
Reexamination Certificate
2011-05-24
2011-05-24
Williams, Alexander O (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Die bond
C257SE23010, C257SE23040, C257SE23145, C257SE31117, C257SE23043, C257S667000, C257S796000, C257S671000, C257S672000, C257S670000, C257S730000, C257S784000, C257S786000, C257S676000
Reexamination Certificate
active
07948091
ABSTRACT:
A mounting structure for a semiconductor element is disclosed. The semiconductor element is bonded to a die pad through an adhesive film, which is formed by applying a predetermined amount of a paste adhesive onto the surface of the die pad and placing the semiconductor element on the die pad so as to press and spread the adhesive between the lower surface of the semiconductor element and the die pad. A wire extends between the semiconductor element and a terminal pad disposed around the die pad. The die pad includes plural grooves in the surface thereof. Each of the grooves extends from the center of the die pad toward a peripheral edge of the die pad and ends at the inner side of the peripheral edge of the die pad.
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Daikuhara Osamu
Ohse Yuko
Takauchi Hideki
Fujitsu Component Limited
Fujitsu Limited
Staas & Halsey , LLP
Williams Alexander O
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