Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-05-17
2011-05-17
Tang, Minh N (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C345S904000, C349S040000, C349S149000
Reexamination Certificate
active
07944228
ABSTRACT:
In a mother substrate for a lower substrate, a substrate for a display panel and a method of manufacturing a display panel, the substrate for the display panel includes a lower substrate and an upper substrate facing the lower substrate. The lower substrate includes an inspection line that receives a first inspection signal externally provided, a gate driving part that outputs a second inspection signal in response to the first inspection signal from the inspection line, and a pixel part driven in response to the second inspection signal. The inspection line is disposed on a grinding area. Thus, the display panel may have an enhanced productivity and an improved yield, on which the gate driving part is formed.
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Chinese Office Action for application No. 200410008429.1 with English Translation; Issue date Jul. 6, 2007.
Cantor & Colburn LLP
Samsung Electronics Co,. Ltd.
Tang Minh N
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