Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-02-07
2010-12-14
Andújar, Leonardo (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S305000, C257S509000, C257S647000, C257SE21320, C257SE21550
Reexamination Certificate
active
07851858
ABSTRACT:
Provided is a semiconductor device formed to an SOI substrate including a MOS transistor in which a parasitic MOS transistor is suppressed. The semiconductor device formed on the SOI substrate by employing a LOCOS process is structured such that a part of a polysilicon layer to becomes a gate electrode includes: a first conductivity type polysilicon region corresponding to a region of the silicon active layer which has a constant thickness and is to become a channel; and second conductivity type polysilicon regions corresponding to LOCOS isolation edges in each of which a thickness of the silicon active layer decreases.
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Hasegawa Hisashi
Yoshino Hideo
Andújar Leonardo
Arroyo Teresa M
Brinks Hofer Gilson & Lione
Seiko Instruments Inc.
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