MOSFET and production method of semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21409, C438S289000

Reexamination Certificate

active

07964921

ABSTRACT:
To provide a MOSFET which is increased in substrate bias effect γ without increasing parasitic capacitance and junction leak current, the MOSFET includes: a gate electrode (104) formed on a semiconductor substrate (101) and an insulating film (103); a sidewall insulating film (106) covering the side surface of the gate electrode (104); and source/drain regions surrounded by the sidewall insulating film (106) and a shallow trench isolation (102) in a self-alignment manner, in which an impurity concentration of a first conductivity type which is the same type as a well-forming impurity has a profile becoming, in a lower direction of the gate electrode (104), lower in a channel formation region, then higher and again lower, and a high-concentration first conductivity type impurity region (110) is provided, in which the impurity concentration of the first conductivity type is formed to be low in the source/drain regions and to be high below the gate electrode (104) sandwiched between the source/drain regions.

REFERENCES:
patent: 5489543 (1996-02-01), Hong
patent: 5766998 (1998-06-01), Tseng
patent: 6501131 (2002-12-01), Divakaruni et al.
patent: 6743682 (2004-06-01), Woerlee et al.
patent: 6812103 (2004-11-01), Wang et al.
patent: 6897526 (2005-05-01), Miyanaga et al.
patent: 7-161978 (1995-06-01), None
patent: 11-233769 (1999-08-01), None
patent: 2001-68672 (2001-03-01), None
patent: 2001-77361 (2001-03-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

MOSFET and production method of semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with MOSFET and production method of semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and MOSFET and production method of semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2620209

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.