Monolithic IC and MEMS microfabrication process

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Physical stress responsive

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S050000, C438S053000, C438S054000, C438S056000, C438S704000, C438S705000, C438S706000, C257S415000, C257S416000, C257S417000, C257S418000, C257S419000

Reexamination Certificate

active

07875484

ABSTRACT:
Monolithic IC/MEMS processes are disclosed in which high-stress silicon nitride is used as a mechanical material while amorphous silicon serves as a sacrificial layer. Electronic circuits and micro-electromechanical devices are built on separate areas of a single wafer. The sequence of IC and MEMS process steps is designed to prevent alteration of partially completed circuits and devices by subsequent high process temperatures.

REFERENCES:
patent: 5573679 (1996-11-01), Mitchell
patent: 6174820 (2001-01-01), Habermehl et al.
patent: 6521965 (2003-02-01), Lutz
patent: 6943037 (2005-09-01), Anagnostopoulos
patent: 7078337 (2006-07-01), Campbell
patent: 7160752 (2007-01-01), Ouellet et al.
patent: 7375874 (2008-05-01), Novotny et al.
patent: 2004/0220650 (2004-11-01), Houben et al.
patent: 2005/0177045 (2005-08-01), Degertekin et al.
patent: 2006/0131501 (2006-06-01), Ikushima et al.
patent: 2007/0037311 (2007-02-01), Izumi et al.
patent: 2008/0122431 (2008-05-01), Berkcan et al.
Larry Hornbeck, “Digital Light Processing and MEMS: An Overview”, Texas Instruments website, undated, 3 pages.
Sandia National Laboratories (author unknown), “SUMMiT V Overview”, Sandia National Laboratories website, undated, 3 pages.
David Grosjean, et al. “Using advance macrodefect inspection technology in MEMS processes”, Micro Magazine website, undated, 8 pages.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Monolithic IC and MEMS microfabrication process does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Monolithic IC and MEMS microfabrication process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Monolithic IC and MEMS microfabrication process will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2710112

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.