Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Reexamination Certificate
2008-01-01
2008-01-01
Berman, Jack I. (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
Electron microscope type
C250S310000, C250S305000, C250S3960ML
Reexamination Certificate
active
07315024
ABSTRACT:
An invention providing a scanning electron microscope composed of a monochromator capable of high resolution, monochromatizing the energy and reducing chromatic aberrations without significantly lowering the electrical current strength of the primary electron beam. A scanning electron microscope is installed with a pair of sectorial magnetic and electrical fields having opposite deflection directions to focus the electron beam and then limit the energy width by means of slits, and another pair of sectorial magnetic and electrical fields of the same shape is installed at a position forming a symmetrical mirror versus the surface containing the slits. This structure acts to cancel out energy dispersion at the object point and symmetrical mirror positions, and by spatially contracting the point-converged spot beam with a converging lens system, improves the image resolution of the scanning electron microscope.
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Ezumi Makoto
Ose Yoichi
Otaka Tadashi
Sato Mitsugu
Taya Shunroku
Berman Jack I.
Dickstein & Shapiro LLP
Hashmi Zia R.
Hitachi High-Technologies Corporation
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