Module test card

Details Module test card Module test card

1993-08-06

1995-12-19

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

439 66, G01R 104

Patent

active

054771609

ABSTRACT:
Manufacturing of semiconductor devices is facilitated when the device chip carriers of the devices are tested, prior to population of chips thereon, by a module test card. The module test card is formed by a test substrate and a plurality of test chips mounted on the test substrate. Connections are provided on the test substrate for connecting to a tester. Through the module test card, the device chip carriers are tested under simulation of their operating conditions.

REFERENCES:
patent: 3634807 (1972-02-01), Grobe
patent: 3746973 (1973-07-01), McMahon, Jr.
patent: 4760335 (1988-07-01), Lindberg
patent: 4937203 (1990-06-01), Eichelberger et al.
patent: 5007163 (1991-04-01), Pope et al.
patent: 5053698 (1991-10-01), Ueda

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