Optics: measuring and testing – Of light reflection
Reexamination Certificate
2008-04-22
2008-04-22
Lauchman, Layla G. (Department: 2877)
Optics: measuring and testing
Of light reflection
C356S447000
Reexamination Certificate
active
07362441
ABSTRACT:
A modulated reflectance measurement system includes lasers for generating an intensity modulated pump beam and a UV probe beam. The pump and probe beams are focused on a measurement site within a sample. The pump beam periodically excites the measurement site and the modulation is imparted to the probe beam. For one embodiment, the wavelength of the probe beam is selected to correspond to a local maxima of the temperature reflectance coefficient of the sample. For a second embodiment, the probe laser is tuned to either minimize the thermal wave contribution to the probe beam modulation or to equalize the thermal and plasma wave contributions to the probe beam modulation.
REFERENCES:
patent: 4522510 (1985-06-01), Rosencwaig et al.
patent: 4634290 (1987-01-01), Rosencwaig et al.
patent: 4636088 (1987-01-01), Rosencwaig et al.
patent: 4710030 (1987-12-01), Tauc et al.
patent: 5034611 (1991-07-01), Alpern et al.
patent: 5074669 (1991-12-01), Opsal
patent: 5298970 (1994-03-01), Takamatsu et al.
patent: 5574562 (1996-11-01), Fishman et al.
patent: 5633711 (1997-05-01), Nelson et al.
patent: 5978074 (1999-11-01), Opsal et al.
patent: 6268916 (2001-07-01), Lee et al.
patent: 6411390 (2002-06-01), Nikoonahad et al.
J.A. Batista et al., “Contrast and sensitivity enhancement to Photothermal Reflectance Microscopy through the use of specific probing wavelengths: applications to microelectronics,”Analytical Sciences, vol. 17 Special Issue, Apr. 2001, pp. s73 - s57.
S. Holéet al., “Wavelength Multiplexed Photoreflectance for submicronic thermal imaging,”ESPCI Poster at 12 ICPPP(Toronto, Jun. 23-27, 2002), 1 page in length.
Nicolaides Lena
Opsal Jon
Rosencwaig Allan
Salnik Alex
Kla-Tencor Corporation
Lauchman Layla G.
Stallman & Pollock LLP
LandOfFree
Modulated reflectance measurement system using UV probe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Modulated reflectance measurement system using UV probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Modulated reflectance measurement system using UV probe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2791998