Modular test controller with BIST circuit for testing...

Details Modular test controller with BIST circuit for testing... Modular test controller with BIST circuit for testing...

2008-04-08

2008-04-08

Chung, Phung My (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S733000, C365S201000

Reexamination Certificate

active

10304506

ABSTRACT:
A modular test controller with a built-in self-test (BIST) circuit for testing an embedded DRAM (eDRAM) circuit is provided. The test controller includes a built-in self-test (BIST) core for performing tests, the BIST core including proven testing algorithms; a selectable tester interface for interfacing the BIST core with an external tester; and a selectable eDRAM interface for interfacing the BIST core with an eDRAM, the eDRAM including a plurality of memory cells for storing data. The present invention allows semiconductor device designers to keep to one testflow and reuse a proven BIST core over multiple ASIC (Application Specific Integrated Circuits) products/generations.

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