Modular manipulation system for manipulating a sample under...

Details Modular manipulation system for manipulating a sample under... Modular manipulation system for manipulating a sample under...

2005-05-10

2005-05-10

Lee, John R. (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

Analyte supports

Reexamination Certificate

active

06891170

ABSTRACT:
A modular manipulation system and method for using such modular manipulation system for manipulating a sample under study with a microscope are provided. According to at least one embodiment, a platform is provided that comprises an interface to a microscope, a sample stage, and a plurality of interfaces for receiving manipulator modules for manipulating a sample arranged on the sample stage. Preferably, the plurality of interfaces for receiving manipulator modules are each capable of detachably coupling a manipulator module to the platform. Thus, in a preferred embodiment, a user may selectively couple one or more desired manipulator modules to the platform to enable a desired type of manipulation to be performed on a sample under study. Accordingly, a preferred embodiment enables great flexibility in configuring a manipulation system in a desired manner.

REFERENCES:
patent: 3134942 (1964-05-01), Rhodes
patent: 3535515 (1970-10-01), Jones et al.
patent: 3714423 (1973-01-01), Lucas
patent: 4463257 (1984-07-01), Simpkins et al.
patent: 4587431 (1986-05-01), Uemura
patent: 4601551 (1986-07-01), Pettingell et al.
patent: 4729646 (1988-03-01), Clark et al.
patent: 4798989 (1989-01-01), Miyazaki et al.
patent: 4919001 (1990-04-01), Ogiwara et al.
patent: 5036205 (1991-07-01), Clement et al.
patent: 5055680 (1991-10-01), Kesmodel et al.
patent: 5124645 (1992-06-01), Rhoden et al.
patent: 5225683 (1993-07-01), Suzuki et al.
patent: 5237238 (1993-08-01), Berghaus et al.
patent: 5412503 (1995-05-01), Nederlof
patent: 5455420 (1995-10-01), Ho et al.
patent: 5510615 (1996-04-01), Ho et al.
patent: 5568004 (1996-10-01), Kleindiek
patent: 5635836 (1997-06-01), Kirtley et al.
patent: 5756997 (1998-05-01), Kley
patent: 5922179 (1999-07-01), Mitro et al.
patent: 5939816 (1999-08-01), Culp
patent: 6000280 (1999-12-01), Miller et al.
patent: 6002136 (1999-12-01), Naeem
patent: 6127681 (2000-10-01), Sato et al.
patent: 6127682 (2000-10-01), Nakamoto
patent: 6198299 (2001-03-01), Hollman
patent: 6279389 (2001-08-01), Adderton et al.
patent: 6346710 (2002-02-01), Ue
patent: 6403968 (2002-06-01), Hazaki et al.
patent: 6452307 (2002-09-01), Olin et al.
patent: 6501289 (2002-12-01), Takekoshi
patent: 6538254 (2003-03-01), Tomimatsu et al.
patent: 6583413 (2003-06-01), Shinada et al.
patent: 20010044156 (2001-11-01), Kelly et al.
patent: 20020064341 (2002-05-01), Fauver et al.
patent: 2001198896 (2001-07-01), None
patent: 2002033366 (2002-01-01), None
patent: WO 9613724 (1996-05-01), None
patent: WO9620495 (1996-07-01), None
patent: WO 0010191 (1999-08-01), None
patent: WO0010191 (2000-02-01), None
patent: WO01/09965 (2001-02-01), None
patent: WO02/16089 (2002-02-01), None
S. Fatikow, et al., “A Flexible Microrobot-Based Microassembly Station”, University of Kartsruhe, Institute for Process Control and Robotics, Kaiserstr. 12 (40.28), D-76128, Karlsruhe, Germany.
“Investment Approaches: Lux NanoSphere: Measurement”, Nanotechnology, The Nanotech Report 2001, pp. 122-136.
Technical Data from Klocke Nanotechnik, Dr. Volker Klocke, Aachen, Germany, printed Nov. 2002, 85 pages.
Yu, Minfeng et al., “Three-dimensional manipulation of carbon nanotubes under a scanning electron microscope”, 1999 IOP Publishing Ltd., pp. 244-252.
U.S. Appl. No. 10/173,542, filed Jun. 17, 2002, Dyer et al.
Fatikow, et al., “A Flexible Microrobot-Based Microassembly Station,” Emerging Technologies and Factory Automation, 1999. Proceedings ETFA '99. 1999 7thIEEE International Conference, Barcelona, Spain Oct. 18-21, 1999, Piscataway, NJ USA, pp. 397-406.

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