Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2007-10-16
2007-10-16
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C702S099000, C374S100000, C073S023250
Reexamination Certificate
active
11202269
ABSTRACT:
A modeling module is disclosed that couples to a modular platform chassis. The modeling module includes a resident management controller to implement a test to model a component layout for a module to be received and coupled to the modular platform chassis. The test includes an operating thermal load for a component resident on the module at a given location. The module has a dimensional length and width that is similar to that of the modeling module. The modeling module also includes a thermal load device that is responsive to the management controller. The thermal load device is to implement at least a portion of the test by simulating the operating thermal load for the component resident on the module at the given location.
REFERENCES:
patent: 7084595 (2006-08-01), Brogardh et al.
Bross Kevin W.
Chandwani Neelam
Dodeja Rakesh
Hiremath Chetan
Mukherjee Udayan
Barlow John
Crawford Ted A.
Intel Corporation
Kundu Sujoy
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