Modeling miller effect in static timing analysis

Details Modeling miller effect in static timing analysis Modeling miller effect in static timing analysis

2005-09-06

2005-09-06

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S617000, C702S065000, C716S030000

Reexamination Certificate

active

06940293

ABSTRACT:
A method is contemplated. According to the method, capacitances in a first resistance/capacitance (RC) extraction corresponding to a circuit are modified. Each capacitance is modified to estimate Miller effect on that capacitance. A ratio of a total capacitance on a first wire after the modification in the first RC extraction to a total capacitance on the first wire before the modification in the first RC extraction is calculated. Capacitances in a second RC extraction that are coupled to the first wire are modified according to the ratio. The second RC extraction is a reduced extraction as compared to the first RC extraction. A timing analysis is performed for the circuit using the second RC extraction with capacitances modified to estimate Miller effect.

REFERENCES:
patent: 4219770 (1980-08-01), Weinert
patent: 5864602 (1999-01-01), Needle
patent: 6522152 (2003-02-01), Tonti et al.
“Static Crosstalk & IR Drop Delay Analysis,” Synopsys, Inc., Sep. 2002, 11 pages.
“Crosstalk Aware Static Timing Analysis Environment,” Franzini and Forzan, STMicroelectronics, v. C. Olivettie, 2 20041 Agrate B. (MI), Italy, SNUG Europe 2001, 11 pages, no month available.
“Prime Time SI; Static Crosstalk Analysis,” Synopsys, Inc., 2001, 4 pages, no month available.

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