Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Optimization
Reexamination Certificate
2011-08-23
2011-08-23
Lin, Sun (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Optimization
C716S100000, C716S103000, C716S106000
Reexamination Certificate
active
08006220
ABSTRACT:
A method and system for performing multi-objective optimization of a multi-parameter design having several variables and performance metrics. The optimization objectives include the performance values of surrogate models of the performance metrics and the uncertainty in the surrogate models. The uncertainty is always maximized while the performance metrics can be maximized or minimized in accordance with the definitions of the respective performance metrics. Alternatively, one of the optimization objectives can be the value of a user-defined cost function of the multi-parameter design, the cost function depending from the performance metrics and/or the variables. In this case, the other objective is the uncertainty of the cost function, which is maximized. The multi-parameter designs include electrical circuit designs such as analog, mixed-signal, and custom digital circuits.
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Breen Kristopher
Callele David
McConaghy Trent Lorne
Rusaw Shawn
Allard Louis B.
Borden Ladner Gervais LLP
Lin Sun
Solido Design Automation Inc.
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