Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2008-05-13
2008-05-13
Le, Dieu-Minh (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
Reexamination Certificate
active
07373552
ABSTRACT:
A system and appertaining method isolates a hardware or user error in a software controlled apparatus e.g., an NMR-apparatus. A diagnostic function is added to an event log that uses a causality model to analyze the event log. A series of events in the event log is evaluated by comparing the events with at least one of a number of root cause related patterns, and a best match of these patterns is used to assign a root cause for the error. Various repair actions may be associated based on a probabilistic model. Additional information may be utilized to modify or improve respective probabilities associated with causes and/or repair actions. This additional information may utilize other automated diagnostic information or may query users for additional information.
REFERENCES:
patent: 4881230 (1989-11-01), Clark et al.
patent: 4972453 (1990-11-01), Daniel, III et al.
patent: 5127012 (1992-06-01), Hiliger
patent: 5293556 (1994-03-01), Hill et al.
patent: 5544308 (1996-08-01), Giordano et al.
patent: 5675724 (1997-10-01), Beal et al.
patent: 5712896 (1998-01-01), Lee et al.
patent: 5847972 (1998-12-01), Eick et al.
patent: 5922079 (1999-07-01), Booth et al.
patent: 6473659 (2002-10-01), Shah et al.
patent: 6609217 (2003-08-01), Bonissone et al.
patent: 6691249 (2004-02-01), Barford et al.
patent: 2003/0018619 (2003-01-01), Bae et al.
patent: 2003/0126501 (2003-07-01), Musman
patent: 2004/0059966 (2004-03-01), Chan et al.
patent: 2004/0153819 (2004-08-01), Bjorsne et al.
patent: 2005/0172162 (2005-08-01), Takahashi et al.
patent: 102 44 131 (2004-04-01), None
patent: 1 577 783 (2005-09-01), None
David Heckerman □□ A tutorial on learning with Bayesian Networks □□ Mar. 1995 (Revised 1996) □□ Microsoft□□ Technical Report, pp. 1-2 □□ MSR-TR-95-06.
Le Dieu-Minh
Schiff & Hardin LLP
Siemens Aktiengesellschaft
LandOfFree
Model based diagnosis and repair for event logs does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Model based diagnosis and repair for event logs, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Model based diagnosis and repair for event logs will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2786625