Mirror node process verification

Details Mirror node process verification Mirror node process verification

2004-10-18

2009-10-13

Mehta, Bhavesh M (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

Reexamination Certificate

active

07602958

ABSTRACT:
An inspection image analysis system. At least one image processing computer is configured to receive and analyze at least one portion of an image. At least one test computer is configured to receive at least one common portion of the image also received by the at least one image processing computer, and to analyze the at least one common portion, using equivalent image processes as the corresponding at least one image processing computer. A job manager is configured to assign the common portion and to configure the corresponding image processing computer and the test computer to run equivalent image processes.

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patent: 2003/0098879 (2003-05-01), Mathews
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patent: 3208573 (1983-09-01), None
patent: 3225455 (1984-01-01), None
patent: WO0068884 (2000-11-01), None

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