Miniaturized virtual grounding nonvolatile semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S321000, C365S185010

Reexamination Certificate

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07411242

ABSTRACT:
The object of the present invention is to provide a new nonvolatile semiconductor memory device and its manufacturing method for the purpose of miniaturizing a virtual grounding type memory cell based on a three-layer polysilicon gate, enhancing the performance, and boosting the yield. In a memory cell according to the present invention, a floating gate's two end faces perpendicular to a word line and channel are partly placed over the top of a third gate via a dielectric film. The present invention can reduce the memory cell area of a nonvolatile semiconductor memory device, increase the operating speed, and enhances the yield.

REFERENCES:
patent: 4998220 (1991-03-01), Eitan et al.
patent: 6103573 (2000-08-01), Harari et al.
patent: 6476440 (2002-11-01), Shin
patent: 6759706 (2004-07-01), Kobayashi
patent: 2001/0045590 (2001-11-01), Kobayashi
patent: 2002/0125520 (2002-09-01), Liu
patent: 2003/0103382 (2003-06-01), Kobayashi
patent: 2001-028428 (2001-01-01), None
patent: 2001-085541 (2001-03-01), None

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