Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-05-09
2009-10-13
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S761010, C324S701000, C324S765010, C324S1540PB, C349S031000
Reexamination Certificate
active
07602199
ABSTRACT:
An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays. The apparatus includes a prober assembly that is movable relative to the large area substrate and may be configured to test various patterns of displays and contact points. The prober assembly is also configured to test fractional sections of the large area substrate. The apparatus also includes a test chamber configured to store at least two prober assemblies within an interior volume.
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Brunner Matthias
Johnston Benjamin M.
Krishnaswami Sriram
Liu Yong
Nguyen Hung T.
Applied Materials Inc.
Kusumakar Karen M
Nguyen Ha Tran T
Patterson & Sheridan LLP
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